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TAP1500 1.5 GHz有源探頭Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs.
Key features
- Outstanding electrical performance
- ≥1.5 GHz probe bandwidth
- <267 ps rise time
- ≤1 pF input capacitance
- 1 M? input resistance
- -8 V to +8 V input dynamic range
- -10 V to +10 VDC input offset range
- Versatile mechanical performance
- Small compact probe head for probing small geometry circuit elements
- DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
- Robust design for reliability
- Easy to use
- Connects directly to oscilloscopes with the TekVPI™ probe interface
- Provides automatic units scaling and readout on the oscilloscope display
- Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset
- Remote GPIB/USB probe control through the oscilloscope
- Applications
- High-speed Digital Systems Design
- Component Design and Characterization
- Manufacturing Engineering and Test
- Educational Research
- Signals with Voltage Swings up to 16 V
TAP1500 1.5 GHz有源探頭 active probes for TekVPI™ probe interface
Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP1500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:
- Lower DUT loading effects with ≤1 pF input capacitance and 1 M? input resistance
- Versatile DUT connectivity for attaching to small SMDs
- Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes